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Pressure dependence of thickness and refractive index of thin PMMA‐films investigated by surface plasmon and optical waveguide spectroscopy
Author(s) -
Kleideiter Gerd,
Lechner Manfred Dieter,
Knoll Wolfgang
Publication year - 1999
Publication title -
macromolecular chemistry and physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.57
H-Index - 112
eISSN - 1521-3935
pISSN - 1022-1352
DOI - 10.1002/(sici)1521-3935(19990501)200:5<1028::aid-macp1028>3.0.co;2-8
Subject(s) - refractive index , materials science , thin film , hydrostatic pressure , spectroscopy , optics , polymer , poly(methyl methacrylate) , reflection (computer programming) , attenuated total reflection , methyl methacrylate , analytical chemistry (journal) , chemistry , composite material , optoelectronics , nanotechnology , physics , quantum mechanics , monomer , chromatography , computer science , thermodynamics , programming language
Total internal reflection (TIR) and attenuated total reflection (ATR) measurements in the Kretschmann configuration have been performed at 25°C with poly(methyl methacrylate) (PMMA) films (of ca. 2.5 μm thickness) spincoated on top of a 50 nm thick gold layer, as a function of the applied hydrostatic pressure, ranging from p = 1·10 5 to 1 050·10 5 Pa. The analysis of guided optical modes allows for the separate determination of the refractive index n and the thickness d of the polymer films as a function of pressure. The pressure media in contact with the PMMA films were water, ethanol, and methanol. Thermodynamic theories for the density of solids and fluids in combination with the Lorentz‐Lorenz equation for their optical properties fit the experimental data quite well.