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Facilitated Tip‐Positioning and Applications of Non‐Electrode Tips in Scanning Electrochemical Microscopy Using a Shear Force Based Constant‐Distance Mode
Author(s) -
Hengstenberg Andreas,
Kranz Christine,
Schuhmann Wolfgang
Publication year - 2000
Publication title -
chemistry – a european journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.687
H-Index - 242
eISSN - 1521-3765
pISSN - 0947-6539
DOI - 10.1002/(sici)1521-3765(20000502)6:9<1547::aid-chem1547>3.0.co;2-c
Subject(s) - scanning electrochemical microscopy , amperometry , chemistry , analytical chemistry (journal) , electrode , electrochemistry , physics , chromatography
In scanning electrochemical microscopy (SECM) a microelectrode is usually scanned over a sample without following topographic changes (constant‐height mode). Therefore, deconvolution of effects from distance variations arising from non‐flat sample surface and electrochemical surface properties is in general not possible. Using a shear force‐based constant distance mode, information about the morphology of a sample and its localized electrochemical activity can be obtained simultaneously. The setup of the SECM with integrated constant‐distance mode and its application to non‐flat or tilted surfaces, as well as samples with three‐dimensional surface structures are presented and discussed. The facilitated use of non‐amperometric tips in SECM like enzyme‐filled glass capillaries is demonstrated.