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Short‐circuit phenomenon through hot gas ejected from molded case circuit breakers during high current interruption process and prevention of its occurrence
Author(s) -
Yokomizu Yasunobu,
Matsumura Toshihiro,
Kito Yukio
Publication year - 2000
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/(sici)1520-6416(20000715)132:1<22::aid-eej4>3.0.co;2-y
Subject(s) - circuit breaker , short circuit , conductance , current (fluid) , mechanics , materials science , electrical engineering , engineering , voltage , physics , condensed matter physics
Abstract An experimental investigation on short‐circuit phenomenon through ejected hot gas between source‐side terminals in molded case circuit breakers (MCCBs) was performed. The rate of occurrence of the short‐circuit phenomenon was found to increase with the peak value of the breaking current and with the order of the breaking test. The conductance of the ejected hot gas was also found to rise with the peak value of the breaking current and with the order of the breaking test. These results indicate that the hot gas of high conductance is the cause of the short‐circuit phenomenon. Some effective means were taken in the MCCB to reduce the conductance of the hot gas. Decreasing the conductance of the hot gas successfully prevented the occurrence of short‐circuit phenomenon. © 2000 Scripta Technica, Electr Eng Jpn, 132(1): 22–29, 2000