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Steady‐state stability of shaft torsional oscillation in an ac‐dc interconnected system with self‐commutated converters
Author(s) -
Nishi Kohachiro,
Nakajima Tatsuhito,
Yokoyama Akihiko
Publication year - 1999
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/(sici)1520-6416(199909)128:4<25::aid-eej4>3.0.co;2-k
Subject(s) - converters , control theory (sociology) , thyristor , oscillation (cell signaling) , electric power system , engineering , power electronics , power (physics) , voltage , electrical engineering , physics , computer science , control (management) , quantum mechanics , artificial intelligence , biology , genetics
Recent progress in power electronics technology makes it possible to consider applying self‐commutated converters using gate turn‐off thyristors (GTOs) to HVDC transmission systems. Since the self‐commutated converter can be operated stably without depending on ac‐side voltage, the magnitude and the phase angle of the converter output voltage can be controlled independently. Therefore, this type of converter will improve voltage stability at its ac side. On the other hand, shaft torsional oscillation of a thermal power plant caused by the interaction between the shaft‐generator system and the control system of the self‐commutated converter is still an open problem. In this paper, a linearized model for eigenvalue analysis of a power system, including HVDC interconnection with self‐commutated converters, is described to analyze the effect of the self‐commutated converter on the shaft torsional oscillation of a thermal power plant. Then, numerical results from the eigenvalue analysis of the shaft torsional oscillation are presented. Results obtained by the frequency response method are also reported. The numerical results make it clear that parameter regions of DC‐AVR and ACR control systems of self‐commutated converters exist where the shaft torsional oscillation may be caused. © 1999 Scripta Technica, Electr Eng Jpn, 128(4): 25–37, 1999