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A risk‐informed methodology for parts selection and management
Author(s) -
Jackson Margaret,
Sandborn Peter,
Pecht Michael,
HemensDavis Chantal,
Audette Pierre
Publication year - 1999
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/(sici)1099-1638(199907/08)15:4<261::aid-qre269>3.0.co;2-0
Subject(s) - obsolescence , selection (genetic algorithm) , quality (philosophy) , reliability (semiconductor) , risk analysis (engineering) , risk management , quality management , computer science , engineering , reliability engineering , operations management , process management , business , management system , marketing , artificial intelligence , philosophy , power (physics) , physics , epistemology , finance , quantum mechanics
This paper presents an overview of a ‘risk‐informed’ methodology for electronic parts selection and management, which addresses both application‐independent processes (part availability, part cost, part manufacturer quality, distributor quality and part family quality and integrity) and application‐specific processes (determination of the local environment, part performance, part reliability, assembly and life cycle obsolescence). Risk management activities, which follow the parts selection activities, are also addressed. Copyright © 1999 John Wiley & Sons, Ltd.