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Polarization and fluctuation characteristics of tantalum solid electrolyte capacitors
Author(s) -
Zednicek T.,
Sikula J.,
Hruska P.,
Koktavy B.,
Vasina P.,
Koktavy P.,
Hashigushi S.
Publication year - 1998
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/(sici)1099-1638(199803/04)14:2<73::aid-qre162>3.0.co;2-i
Subject(s) - polarization (electrochemistry) , impurity , tantalum , dielectric , capacitor , materials science , electrolyte , ion , optoelectronics , voltage , chemistry , physics , electrode , metallurgy , organic chemistry , quantum mechanics
A new method of tantalum capacitor testing and reliability prediction is presented based on the analysis of polarization mechanisms and noise characteristics. Polarization mechanisms of the Ta 2 O 5 dielectric layer include electron polarization, fast ion polarization and ion relaxation polarization. Impurities usually add a fourth polarization type, migration polarization, which is effective in the mHz–kHz frequency region. © 1998 John Wiley & Sons, Ltd.