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Book Review: Failure mechanisms in semiconductor devices. By E.A.Amerasekera and F.N.Najm, Chichester:Wiley, 1997
Author(s) -
O'Connor P. D. T.
Publication year - 1998
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/(sici)1099-1638(199801/02)14:1<59::aid-qre131>3.0.co;2-h
Subject(s) - citation , reliability (semiconductor) , library science , computer science , physics , thermodynamics , power (physics)