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Quality improvement for RC06 chip resistor
Author(s) -
Jeng YannChyn,
Guo ShinMing
Publication year - 1996
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/(sici)1099-1638(199611)12:6<439::aid-qre61>3.0.co;2-0
Subject(s) - taguchi methods , categorical variable , resistor , orthogonal array , quality (philosophy) , chip , computer science , scheme (mathematics) , noise (video) , data mining , reliability engineering , electronic engineering , pattern recognition (psychology) , artificial intelligence , engineering , mathematics , machine learning , electrical engineering , telecommunications , voltage , mathematical analysis , philosophy , epistemology , image (mathematics)
This paper studies a quality improvement case of extremely thin and light chip resistor RC06. We use an L 18 (2 1 × 3 7 ) orthogonal array allocating eight control factors in an experimental plan. The quality response data are inevitably considered to be ordered categorical. Six categories are classified for the quality of chips. Both Taguchi's accumulation analysis method (1966) and Nair's scoring scheme (1986) are employed in analysing the data. Furthermore, we develop a weighted probability scoring scheme (WPSS) and a signal‐to‐noise (SN) ratio to reach an optimal solution. Finally, a comparison among the three approaches is made.