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Device and materials characterization in manufacturing
Author(s) -
Sites J.,
Rand J.,
Kazmerski L. L.,
Phillips J. E.
Publication year - 1997
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/(sici)1099-159x(199709/10)5:5<371::aid-pip188>3.0.co;2-q
Subject(s) - characterization (materials science) , process engineering , manufacturing engineering , computer science , production (economics) , systems engineering , nanotechnology , engineering , mechanical engineering , materials science , economics , macroeconomics
Diagnostic measurements of thin‐film materials and complete devices and solar modules are necessary to optimize both the processes and the resulting modules. Measurements provide the connection between processing and performance. In this workshop, the panel and audience examined both in situ and post‐processing diagnostic measurements and how they can be utilized in a manufacturing environment to monitor processes and performance. The need for future measurement technology is increasingly for on‐site, manufacturing‐compatible, non‐contact techniques giving rapid feedback in the production environment. © 1997 John Wiley & Sons, Ltd.