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Scanning near‐field optical microscopy by near‐field reflectance enhancement: a versatile and valid technique
Author(s) -
Kaupp Gerd,
Herrmann Andreas
Publication year - 1999
Publication title -
journal of physical organic chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.325
H-Index - 66
eISSN - 1099-1395
pISSN - 0894-3230
DOI - 10.1002/(sici)1099-1395(199902)12:2<141::aid-poc101>3.0.co;2-n
Subject(s) - near field scanning optical microscope , optics , chemistry , optical microscope , field (mathematics) , microscopy , near and far field , resolution (logic) , reflectivity , reflection (computer programming) , nanotechnology , materials science , scanning electron microscope , physics , mathematics , artificial intelligence , computer science , pure mathematics , programming language
The validity of reflection‐back‐to‐the‐fiber SNOM (scanning near‐field optical microscopy) has been unduely questioned by an erratic approach curve that disputed the enhancement of near‐field reflectance. It is shown now that only truncated (broken) tips without metal coating do not experience the enhancement when approached close to shear‐force distance. However, sharp uncoated tips continue to show up the near‐field enhancement, and chemical contrast on rough surfaces continues to be of basic value at submicroscopic resolution. It is pointed out how a good tip may be immediately differentiated from a broken one. Copyright © 1999 John Wiley & Sons, Ltd.