Premium
Incorporating non‐linear lumped elements in FDTD: the equivalent source method
Author(s) -
Mix Jason,
Dixon Jonathan,
Popovic Zoya,
PiketMay Melinda
Publication year - 1999
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/(sici)1099-1204(199901/04)12:1/2<157::aid-jnm323>3.0.co;2-v
Subject(s) - finite difference time domain method , mesfet , solver , equivalent circuit , transcendental equation , finite element method , computer science , electronic engineering , mathematical analysis , voltage , mathematics , topology (electrical circuits) , physics , numerical analysis , engineering , electrical engineering , mathematical optimization , transistor , field effect transistor , optics , thermodynamics
A new approach is presented for modelling three‐dimensional lumped elements in the finite‐difference time‐domain (FDTD) solution of Maxwell's equations. The finite‐difference equations for the lumped element's circuit behaviour are derived to produce discrete relationships between the device's terminal currents and voltages. These difference equations are then implemented in the FDTD grid with equivalent voltage and current sources based on static field approximations. The method can be used for a wide range of applications which include lumped elements that may be passive, active, linear, non‐linear, single, and multiple port devices. The underlying advantages of modelling a lumped element in this manner as compared to the more traditional extended FDTD technique is that the lumped element is easily extended across multiple FDTD cells and the need for a separate transcendental equation solver is eliminated. The method is demonstrated by a specific example based on the Curtice–Cubic non‐linear model for a MESFET. The s‐parameters from an FDTD simulation are compared to the manufacturer's measured data and to results from simulations using Hewlett‐Packard's Microwave Design System (MDS). Finally, the method is used to model the MESFET in a three port oscillator. Copyright © 1999 John Wiley & Sons, Ltd.