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Direct error estimation based on the potential drop in TLM diffusion modelling
Author(s) -
Gui X.,
Haslett J. W.,
Dew S. K.,
Brett M. J.
Publication year - 1998
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/(sici)1099-1204(199809/10)11:5<255::aid-jnm310>3.0.co;2-k
Subject(s) - transmission line , drop (telecommunication) , computer science , diffusion , semiconductor device , electronic engineering , physics , engineering , materials science , thermodynamics , telecommunications , nanotechnology , layer (electronics)
We re‐examine the potential drop method to give a direct estimation of the absolute error in transmission‐line matrix (TLM) diffusion modelling. In particular, the open‐circuit boundary is taken into account. Promising results are presented with a structure relevant to thermal analysis of semiconductor devices. © 1998 John Wiley & Sons, Ltd.