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Modelling of dielectric cavity structures using multiresolution time‐domain analysis
Author(s) -
Robertson Rob,
Tentzeris Emmanouil,
Krumpholz Michael,
Katehi Linda P. B.
Publication year - 1998
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/(sici)1099-1204(199801/02)11:1<55::aid-jnm289>3.0.co;2-1
Subject(s) - finite difference time domain method , wavelet , dielectric , time domain , computation , multiresolution analysis , mathematical analysis , maxwell's equations , scaling , basis function , method of moments (probability theory) , mathematics , algorithm , physics , wavelet transform , computer science , optics , geometry , discrete wavelet transform , statistics , optoelectronics , estimator , computer vision , artificial intelligence
Multiresolution time domain (MRTD) analysis is applied directly to Maxwell's equations to model inhomogeneous dielectric material. In our approach, scaling and wavelet functions are used as a complete basis for the method of moments. The MRTD scheme is used to analyze different types of resonant cavity structures with varying dielectric perturbations in one, two and three dimensions. The results presented here agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computation time in comparison to FDTD, while maintaining the same accuracy of the results. © 1998 John Wiley & Sons, Ltd.