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Epoxy‐amine reticulates observed by infrared spectrometry. II. Modifications of structure and of hydration abilities after irradiation in a dry atmosphere
Author(s) -
Ngono Yvette,
Maréchal Yves
Publication year - 2000
Publication title -
journal of polymer science part b: polymer physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.65
H-Index - 145
eISSN - 1099-0488
pISSN - 0887-6266
DOI - 10.1002/(sici)1099-0488(20000115)38:2<329::aid-polb5>3.0.co;2-t
Subject(s) - atmosphere (unit) , epoxy , mass spectrometry , infrared , amine gas treating , chemistry , irradiation , infrared spectroscopy , polymer chemistry , organic chemistry , chromatography , meteorology , physics , nuclear physics , optics
This article is part of a series of articles devoted to the study of the responsibilities of both humidity and irradiation in the aging process of amine‐cured epoxy resins. The basic technique used in this study is infrared spectrometry. In a previous article we have observed, with this technique, hydration of two kinds of epoxy resins, which are widely used in the nuclear industry. In this article the same technique is used to observe the same resins, which have been previously submitted to ionizing radiations. It allows us to determine the effects these radiations have on these resins at molecular level and how they consequently modify their hydration mechanisms. It could thus be established that irradiation by electrons almost does not induce modifications on resins cured with aromatic diamines, which results in their hydration capacity being only slightly changed. Irradiation by γ rays induces stronger modifications, which reflect themselves in a greater capacity of absorption of water and different ways of fixing H 2 O molecules. Epoxy resins cured with alkyl diamines are more sensitive to irradiation and, after it, absorb a greater amount of H 2 O molecules. After irradiation, steric conditions, which hinder H 2 O molecules to bind on other H 2 O molecules, apparently become less severe. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 38: 329–340, 2000

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