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Rigorous analysis of uniaxial bi‐anisotropic dielectric resonators by the mode matching method
Author(s) -
Aknin N.,
El Moussaoui A.,
Yaich M. Iben,
Essaaidi M.
Publication year - 1999
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/(sici)1099-047x(199909)9:5<385::aid-mmce3>3.0.co;2-h
Subject(s) - anisotropy , dielectric , resonator , dielectric resonator , microwave , materials science , mode (computer interface) , condensed matter physics , optics , physics , optoelectronics , computer science , telecommunications , operating system
Rigorous analysis of uniaxial bi‐anisotropic dielectric resonators is carried out by the mode matching method. To validate our numerical model, results are satisfactorily compared with the literature for a uniaxial electric anisotropic dielectric resonator (DR). Then bi‐anisotropy effects of DRs dielectric materials on their resonant frequencies are studied in detail. ©1999 John Wiley & Sons, Inc. Int J RF and Microwave CAE 9: 385–393, 1999.