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Computation of the capacitance matrix of manhattan geometry planar conductors embedded in multilayered substrates
Author(s) -
Drake Enrique,
Medina Francisco,
Horno Manuel
Publication year - 1998
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/(sici)1099-047x(199809)8:5<386::aid-mmce5>3.0.co;2-a
Subject(s) - computation , classification of discontinuities , biconjugate gradient method , capacitance , mathematical analysis , convolution (computer science) , matrix (chemical analysis) , microstrip , fast fourier transform , integral equation , geometry , strips , electrical conductor , planar , mathematics , algorithm , topology (electrical circuits) , computer science , physics , materials science , optics , electrical engineering , engineering , combinatorics , gradient descent , conjugate residual method , quantum mechanics , composite material , computer graphics (images) , electrode , machine learning , artificial neural network
In this paper we propose an efficient technique for computation of the capacitance matrix of a set of infinitely thin conductor patches embedded in a multilayered medium. The patches present a manhattan‐type shape, i.e., they can be subdivided into a finite number of rectangular regions. The generalized biconjugate gradient method (GBGM) in conjunction with FFT algorithms, is adapted to solve the convolution integral equation governing the free‐charge density distribution on the conductors. Important computational improvements are achieved by including asymptotic extraction techniques in the determination of the space domain periodic Green's functions. The analysis is also applied to the quasistatic modelling of some microstrip discontinuities. © 1998 John Wiley & Sons, Inc. Int J RF and Microwave CAE 8: 386–397, 1998.