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Efficient full‐wave automated design and yield analysis of waveguide components
Author(s) -
Alessandri F.,
Dionigi M.,
Mongiardo M.,
Sorrentino R.
Publication year - 1998
Publication title -
international journal of rf and microwave computer‐aided engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.335
H-Index - 39
eISSN - 1099-047X
pISSN - 1096-4290
DOI - 10.1002/(sici)1099-047x(199805)8:3<200::aid-mmce3>3.0.co;2-n
Subject(s) - gsm , representation (politics) , cad , microwave , admittance parameters , modal analysis , network analysis , matrix representation , matrix (chemical analysis) , waveguide , electronic engineering , component (thermodynamics) , scattering parameters , admittance , process (computing) , computer science , engineering , electrical engineering , telecommunications , physics , engineering drawing , finite element method , electrical impedance , optics , voltage , structural engineering , materials science , law , composite material , operating system , quantum mechanics , political science , thermodynamics , politics , group (periodic table)
Automated circuit design of microwave networks relies on using efficient CAD tools: for waveguide technology, modal analysis has emerged as the most useful electromagnetic simulator, either in the generalized scattering matrix (GSM) formulation or in the generalized admittance matrix (GAM) form. It is demonstrated that, when considering the solution of an entire waveguide component, the GAM approach requires half of the unknowns at the internal ports than the GSM representation, hence allowing considerable gain in efficiency. Process‐oriented yield analysis of microwave components is generally effected by considering a large number of statistically generated geometrical dimensions and by performing a complete full‐wave analysis for each set of dimensions. It is shown that, by using the adjoint network method, it is possible to perform a yield analysis with just one complete analysis of the entire component, hence considerably reducing the numerical effort of yield analysis. © 1998 John Wiley & Sons, Inc. Int J RF and Microwave CAE 8: 200–207, 1998.