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Static secondary ion mass spectrometry (S‐SIMS) Part 2: material science applications
Author(s) -
Adriaens Annemie,
Van Vaeck Luc,
Adams Freddy
Publication year - 1999
Publication title -
mass spectrometry reviews
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 2.035
H-Index - 126
eISSN - 1098-2787
pISSN - 0277-7037
DOI - 10.1002/(sici)1098-2787(1999)18:1<48::aid-mas2>3.0.co;2-i
Subject(s) - chemistry , library science , computer science

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