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Scattering from dihedral corner reflectors with sinusoidally deformed faces
Author(s) -
Corona P.,
D'agostino F.,
Riccio G.,
Toso G.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(20000520)25:4<246::aid-mop6>3.0.co;2-6
Subject(s) - dihedral angle , scattering , corner reflector , microwave , reflector (photography) , optics , electromagnetic radiation , physics , quantum mechanics , light source , hydrogen bond , molecule
The aim of the paper is to analyze, resorting to a rigorous numerical technique, the electromagnetic scattering from a perfectly conducting dihedral corner reflector characterized by sinusoidal deformations. The scattering properties are directly related to the parameters of the sinusoid profile, and to the dimensions of the dihedral corner. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 25: 246–251, 2000.