Premium
A simple procedure to determine the complex permittivity of materials without ambiguity from reflection measurements
Author(s) -
CataláCivera J. M.,
PeñarandaFoix F.,
SánchezHernández D.,
De los Reyes E.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(20000505)25:3<191::aid-mop10>3.0.co;2-5
Subject(s) - permittivity , reflection (computer programming) , microwave , ambiguity , dielectric , network analyzer (electrical) , simple (philosophy) , characterization (materials science) , optics , reflection coefficient , materials science , dielectric permittivity , electronic engineering , computer science , acoustics , algorithm , physics , optoelectronics , engineering , telecommunications , philosophy , epistemology , programming language
A new simple and fast procedure to calculate the dielectric properties of materials without ambiguity has been developed by transforming one‐port reflection measurements, made by an automatic network analyzer, into permittivity values. The measurements needed for the dielectric characterization are taken from two samples of different lengths embedded inside two short‐circuited waveguides with a length relation of 1:n. The technique is validated by good agreement with previously reported results. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 25: 191–194, 2000.