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Determination of electromagnetic disturbances due to the probe used for the measurement of the power deposition of microwave applicators for microwave thermotherapy
Author(s) -
Camart J. C.,
Dietsch A.,
Despretz D.,
Chive M.,
Pribetich J.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(20000505)25:3<168::aid-mop4>3.0.co;2-b
Subject(s) - microwave , finite difference time domain method , deposition (geology) , electronic engineering , power (physics) , engineering , time domain , finite element method , microwave transmission , microwave power , microwave imaging , materials science , electrical engineering , acoustics , optics , optoelectronics , physics , computer science , telecommunications , paleontology , structural engineering , quantum mechanics , sediment , biology , computer vision
The determination of the power deposition diagram is one of the stages of the characterization of microwave applicators. This measurement is obtained by means of a mapping system in which the receiver probe can be considered as a disturbing element. The goal of this paper is to display the influence of these perturbations by modeling using the finite‐difference time‐domain (FDTD) method. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 25: 168–172, 2000.