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Frequency‐selective surfaces with rectangular apertures on uniaxial anisotropic substrates
Author(s) -
Campos A. L. P. S.,
Melo M. A. B.,
D'assunção A. G.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(20000420)25:2<126::aid-mop13>3.0.co;2-t
Subject(s) - anisotropy , microwave , optics , scattering , materials science , reflection (computer programming) , selective surface , dielectric , method of moments (probability theory) , electromagnetic radiation , physics , optoelectronics , mathematics , computer science , statistics , quantum mechanics , estimator , programming language
The method of moments combined with the immitance approach is applied to analyze the scattering of electromagnetic waves from frequency‐selective surfaces (FSSs) on anisotropic substrates. The reflection and transmission coefficients are determined for FSS structures comprised of rectangular apertures on a uniaxial anisotropic layer as a function of the geometry parameters and the dielectric anisotropy. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 25: 126–129, 2000.