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Analysis of a magnetic‐line source on a truncated dielectric layer structure by using a combination of the expansion‐wave concept and physical‐optics methods
Author(s) -
Volski Vladimir A.,
Vandenbosch Guy A. E.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(20000320)24:6<414::aid-mop16>3.0.co;2-m
Subject(s) - microwave , dielectric , physical optics , line source , flexibility (engineering) , optics , physics , radiation , line (geometry) , computational physics , optoelectronics , mathematics , quantum mechanics , geometry , statistics
A new approach based on the combination of the physical‐optics (PO) formulation and the expansion‐wave concept (EWC) has been used to model the radiation pattern of a magnetic‐line source on a truncated dielectric layer structure. The EWC is used to approximate the PO fields by expansion waves. The advantage of the method is that it keeps the flexibility of the PO, allowing the analytical analysis of very complex multilayered substrates. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 24: 414–418, 2000.