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Analysis of effects of light intensity distribution in the phase method to determine the position of a light spot incident on a position‐sensitive detector (PSD)
Author(s) -
Yuan Hongxing,
He Anzhi,
Li Zhenhua,
Wang Zhixing
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(20000105)24:1<40::aid-mop13>3.0.co;2-q
Subject(s) - position (finance) , optics , asymmetry , detector , ray , intensity (physics) , symmetry (geometry) , light intensity , phase (matter) , physics , distribution (mathematics) , microwave , rotational symmetry , mathematics , mathematical analysis , geometry , quantum mechanics , finance , mechanics , economics
In this paper, the effects of light intensity spatial distribution on the determination of the position of a light spot incident on a PSD with the phase method are analyzed based on the linear system theory. And two general cases, symmetry distribution and asymmetry distribution, are presented. At the same time, we also provide several typical examples of the above cases. As a conclusion, the spatially symmetry‐distributed light source is recommended. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 24: 40–45, 2000.