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Bragg reflection filter by periodic photoexcitation of a semiconductor waveguide
Author(s) -
Alphones Arokiaswami
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19991020)23:2<117::aid-mop16>3.0.co;2-a
Subject(s) - waveguide , optics , materials science , microwave , grating , attenuation , semiconductor , guided mode resonance , optoelectronics , photoexcitation , reflection (computer programming) , bragg's law , permittivity , coupled mode theory , resonance (particle physics) , diffraction grating , physics , dielectric , excited state , refractive index , diffraction , programming language , particle physics , quantum mechanics , computer science , nuclear physics
The propagation characteristics of periodically photoinduced plasma grating on a semiconductor slab waveguide have been analyzed by the coupled‐mode theory, and the Bragg reflection characteristics of millimeter waves have been investigated. By periodic optical illumination, the photoinduced plasma grating structure is modeled as a permittivity‐modulated waveguide, and is systematically analyzed. The variation of phase and attenuation constants at the first Bragg resonance is numerically evaluated. The results can be used for optically controlled filters and switches in the millimeter‐wave band. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 23: 117–120, 1999.