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Analytical methods to determine diffraction points on multiple edges and cylindrical scatterers in UTD ray tracing
Author(s) -
Ang T. W.,
Tan S. Y.,
Tan H. S.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990905)22:5<304::aid-mop5>3.0.co;2-e
Subject(s) - ray tracing (physics) , diffraction , microwave , uniform theory of diffraction , optics , tracing , physics , computational physics , computer science , telecommunications , operating system
Analytical methods for determining diffraction points on multiple edges and cylindrical scatterers in UTD‐based propagation models are presented. A versatile 3‐D microwave propagation model is developed based on our new proposed techniques. Prediction results from the model show good agreement with measurement data. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 22: 304–309, 1999.