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Measurement of complex permittivity of low‐loss dielectric material at 94 GHz frequency band using free‐space method
Author(s) -
Otsuka Kenjiro,
Hashimoto Osamu,
Ishida Takahisa
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990905)22:5<291::aid-mop1>3.0.co;2-t
Subject(s) - permittivity , microwave , free space , materials science , dielectric , dielectric loss , relative permittivity , x band , space (punctuation) , frequency band , dielectric permittivity , electronic engineering , optoelectronics , optics , computer science , telecommunications , physics , engineering , bandwidth (computing) , operating system
The complex permittivity of low‐loss dielectric materials (ABS and graft polymer) in the 94 GHz band is measured using the free‐space method. The validity of the free‐space method at 94 GHz is confirmed, and the data of the complex permittivity of these materials are presented. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 22: 291–292, 1999.