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ILDCs for a planar junction between a perfectly conducting half‐plane and a dielectric sheet
Author(s) -
Pelosi G.,
Pochini C.,
Toso G.,
Manara G.,
Nepa P.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990720)22:2<93::aid-mop4>3.0.co;2-c
Subject(s) - planar , dielectric , diffraction , plane (geometry) , microwave , slab , materials science , optics , physics , geometry , optoelectronics , engineering , telecommunications , mathematics , structural engineering , computer science , computer graphics (images)
Incremental length diffraction coefficients (ILDCs) are presented for the canonical problem of a planar junction between a perfectly conducting half‐plane and a thin dielectric slab. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 22: 93–95, 1999.