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Analysis of periodically corrugated gyrotropic waveguide
Author(s) -
Alphones Arokiaswami
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990520)21:4<257::aid-mop7>3.0.co;2-6
Subject(s) - microwave , optics , diagonal , waveguide , radiation , physics , dielectric , perturbation (astronomy) , phase difference , materials science , phase (matter) , optoelectronics , mathematics , geometry , quantum mechanics
A periodically corrugated structure on a thin‐film gyrotropic waveguide is analyzed by the singular perturbation technique based on multiple space scales. The radiation efficiency and phase difference between forward and backward propagation constants are numerically evaluated as a function of the off‐diagonal element in the dielectric tensor of the medium and the thickness of film. The results are quantitatively discussed. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 21: 257–261, 1999.