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Comparison among different approaches for the full‐wave MOM characterization of open‐ended microstrip lines
Author(s) -
Drake E.,
Boix R. R.,
Horno M.,
Sarkar T. K.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990520)21:4<246::aid-mop4>3.0.co;2-j
Subject(s) - microstrip , computation , reflection coefficient , impedance parameters , microwave , method of moments (probability theory) , electrical impedance , reflection (computer programming) , engineering , electronic engineering , computer science , acoustics , physics , mathematics , electrical engineering , algorithm , telecommunications , statistics , programming language , estimator
The reflection coefficient of an open‐ended boxed microstrip line is computed via three different approaches. Two of the approaches are based on the computation of the input impedance at the plane of the excitation, and the third approach is based on the application of the matrix pencil technique. It is shown that the latter approach is more robust and reliable than the former two approaches for the particular problem solved. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 21: 246–248, 1999.