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Modified method of lines for open microstrip structures with finite metallization thickness and conductivity
Author(s) -
Feng N. N.,
Zhou G. R.,
Fang D. G.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990405)21:1<60::aid-mop17>3.0.co;2-9
Subject(s) - microstrip , fast fourier transform , discretization , microwave , computation , dielectric , conductivity , perfect conductor , conductor , mathematical analysis , fourier transform , eigenvalues and eigenvectors , materials science , boundary value problem , electronic engineering , mathematics , computational physics , optics , physics , engineering , algorithm , optoelectronics , telecommunications , composite material , quantum mechanics , scattering
A modified method of lines (MMoL) is developed to analyze open microstrip structures with finite metallization thickness and conductivity. The integration along the normal of the interface between the conductor and dielectric is analytically integrated before the method of lines transform. The periodic boundary conditions (PBC) are employed to simulate the open structure. Due to the uniform discretization which leads to the analytical form of eigenvalues and the application of the fast Fourier transform (FFT) technique, our approach can reduce the computation time significantly. The comparison between our results and published theoretical or experimental ones shows the accuracy and efficiency of this method. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 21: 60–63, 1999.