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Calibrating network analyzers using a through and a line or a through and a match for transmission parameter measurement
Author(s) -
Wan Changhua
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990320)20:6<434::aid-mop20>3.0.co;2-c
Subject(s) - calibration , transmission line , network analyzer (electrical) , port (circuit theory) , microwave , scattering parameters , electronic engineering , reflection (computer programming) , transmission (telecommunications) , line (geometry) , computer science , engineering , electrical engineering , telecommunications , mathematics , statistics , geometry , programming language
This letter presents a general partial two‐port calibration scheme for transmission parameter measurement. Calibrating network analyzers using a through and a line or a through and a match are two applications under the scheme. The second application, which is a new result, is validated experimentally by a comparison with the first one recently discussed. Both applications are useful in characterizing two‐port devices whose reflection parameters are of little interest. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 434–436, 1999.