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A Yee‐based expanded node with dielectric boundary conditions for the TLM method
Author(s) -
Liu J. C.,
Wu Y. C.,
Lee J. Y.,
Jya P. T.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990320)20:6<398::aid-mop12>3.0.co;2-n
Subject(s) - microstrip , microwave , node (physics) , electronic circuit , electronic engineering , dielectric , boundary value problem , boundary (topology) , engineering , topology (electrical circuits) , electrical engineering , computer science , physics , acoustics , telecommunications , mathematics , mathematical analysis
The Yee‐based expanded node with dielectric boundary conditions is introduced here for the TLM method to simulate the electromagnetic characteristics of microwave circuits. This numerical structure is presented graphically, and at the same time, related to the conventional bases straightforwardly. In application, microstrip line circuits including the microstrip line and interdigital structure are analyzed. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 398–403, 1999.