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Temperature‐tunable silicon‐wafer etalon for frequency chirp measurements
Author(s) -
Niemi T.,
Tammela S.,
Kajava T.,
Kaivola M.,
Ludvigsen H.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990205)20:3<190::aid-mop13>3.0.co;2-n
Subject(s) - fabry–pérot interferometer , materials science , optoelectronics , discriminator , optics , chirp , diode , silicon , wafer , microwave , laser , physics , telecommunications , engineering , detector , wavelength
A new device concept for measuring the time‐resolved frequency chirp in modulated laser diodes is presented. It makes use of a solid silicon‐wafer etalon as an optical frequency discriminator. The transmission properties of the etalon are tuned by controlling the refractive index of silicon by tuning the temperature of the etalon. The device allows automated measurements of frequency chirps up to ±25 GHz in optical telecommunication links with a time resolution of about 20 ps. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 190–192, 1999.