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Characterization of surface‐wave radar‐absorbing material
Author(s) -
Niemand P.,
Odendaal J. W.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990120)20:2<131::aid-mop15>3.0.co;2-e
Subject(s) - specular reflection , radar , microwave , free space , reflection (computer programming) , cylinder , optics , time domain , characterization (materials science) , acoustics , surface wave , materials science , engineering , physics , computer science , aerospace engineering , mechanical engineering , telecommunications , computer vision , programming language
A new method to characterize absorber material in a free‐space facility is proposed. Materials are characterized in terms of both their specular reflection and creeping‐wave performance, using a conducting cylinder as the reference target. The difference in time delay between the specular and creeping wave allows the use of time‐domain techniques to evaluate the performance of the material. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 131–132, 1999.