Premium
Study of near‐field coupling phenomena in slotted screens using the generalized circuital analysis
Author(s) -
Balbastre J. V.,
Nuño L.,
Díaz A.
Publication year - 1999
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19990105)20:1<40::aid-mop11>3.0.co;2-2
Subject(s) - finite element method , microwave , coupling (piping) , field (mathematics) , engineering , electronic engineering , physics , topology (electrical circuits) , electrical engineering , telecommunications , structural engineering , mechanical engineering , mathematics , pure mathematics
A generalized circuital analysis (GCA), together with the finite‐element method (FEM), is proposed to study the near‐field coupling phenomena arising in slotted envelopes covering electronic devices. The proposed approach is very systematic and versatile. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 40–44, 1999.