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Skin‐effect resistance of conductors with a trapezoidal cross section
Author(s) -
Guo J.,
Glisson A. W.,
Kajfez D.
Publication year - 1998
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19980820)18:6<387::aid-mop7>3.0.co;2-9
Subject(s) - cross section (physics) , section (typography) , microwave , diagram , electrical conductor , trace (psycholinguistics) , materials science , engineering , electrical engineering , physics , mathematics , telecommunications , computer science , statistics , linguistics , philosophy , quantum mechanics , operating system
A numerical procedure has been applied to a coupled surface integral equation for computing the resistance of an overetched circuit trace with a trapezoidal cross section. A universal diagram of resistance versus normalized frequency is provided for three aspect ratios. The high‐frequency behavior of the resistance is also discussed. © 1998 John Wiley & Sons, Inc. Microwave Opt Technol Lett 18: 387–389, 1998.