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Scattering from the junction of a perfectly conducting half‐plane and a resistive sheet
Author(s) -
Pelosi Giuseppe,
Selleri Stefano,
Manara Giuliano
Publication year - 1998
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19980605)18:2<85::aid-mop1>3.0.co;2-d
Subject(s) - wedge (geometry) , scattering , resistive touchscreen , diffraction , plane wave , optics , microwave , plane (geometry) , physics , geometry , mathematics , engineering , electrical engineering , quantum mechanics
A numerical analysis of plane‐wave scattering from the edge of a penetrable wedge illuminated at normal incidence is presented. The wedge is formed by a perfectly conducting half‐plane and a resistive sheet joining at an arbitrary angle. The diffracted field is determined through the application of the parabolic equation method in conjunction with a finite‐difference (FD) scheme. The solution obtained is valid in the high‐frequency region. © 1998 John Wiley & Sons, Inc. Microwave Opt Technol Lett 18: 85–86, 1998.