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Optically controlled Bragg reflection characteristic of millimeter waves in a corrugated dielectric waveguide
Author(s) -
Alphones Arokiaswami,
Tsutsumi Makoto
Publication year - 1998
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19980420)17:6<352::aid-mop5>3.0.co;2-g
Subject(s) - waveguide , microwave , optics , extremely high frequency , materials science , reflection (computer programming) , millimeter , dielectric , bragg's law , semiconductor , optoelectronics , physics , telecommunications , engineering , programming language , computer science , diffraction
Abstract A corrugated dielectric waveguide with silicon overlay has been analyzed by coupled mode theory to study the variation of Bragg reflection characteristics. By optical illumination, the plasma‐induced semiconductor exhibits an interesting behavior on the propagation characteristics of a corrugated dielectric waveguide. To validate theoretical estimations, experiments have been carried out at Q ‐band. The results could be used for optically controlled filters and switches at millimeter‐wave band. © 1998 John Wiley & Sons, Inc. Microwave Opt Technol Lett 17: 352–357, 1998.