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Pattern of 3‐D source near strip in multilayered region by full‐wave method
Author(s) -
Chuang MingLin,
Chu FuLai
Publication year - 1998
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19980405)17:5<300::aid-mop7>3.0.co;2-g
Subject(s) - strips , near and far field , reciprocity (cultural anthropology) , microwave , plane wave , plane (geometry) , electrical conductor , field (mathematics) , optics , physics , engineering , computer science , geometry , mathematics , algorithm , electrical engineering , telecommunications , psychology , social psychology , pure mathematics
A rigorous full‐wave method is presented to analyze the far‐field pattern of a 3‐D source near conductive strips located in a multilayered region. The far‐field pattern can be in any plane, not only in the principal plane. The reciprocity theorem is applied to simplify the problem. Several numerical results are presented to demonstrate the accuracy and versatility of this method. © 1998 John Wiley & Sons, Inc. Microwave Opt Technol Lett 17: 300–303, 1998.