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A powerful new technique for the quantitative validation of modeled and experimental data
Author(s) -
Williams A. J. M.,
Duffy A. P.,
Woolfson M. S.,
Benson T. M.
Publication year - 1998
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19980405)17:5<284::aid-mop2>3.0.co;2-8
Subject(s) - experimental data , reliability (semiconductor) , computer science , model validation , data mining , reliability engineering , engineering , statistics , mathematics , data science , physics , power (physics) , quantum mechanics
A quantitative validation procedure for comparisons of modeled and experimental data is described. This produces several levels of information, from a straightforward numerical assessment to detailed diagnostic data. Results show that this method has significant advantages over a visual approach in assessing the reliability of modeling techniques against experimental references. © 1998 John Wiley & Sons, Inc. Microwave Opt Technol Lett 17: 284–287, 1998.