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Path loss prediction using a rigorous diffraction coefficient formula
Author(s) -
Zhang Y. P.,
Hwang Y.,
Sheng J. H.
Publication year - 1998
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19980220)17:3<193::aid-mop12>3.0.co;2-6
Subject(s) - diffraction , wedge (geometry) , electrical impedance , path loss , reflection coefficient , path (computing) , microwave , mathematics , mathematical analysis , optics , engineering , physics , geometry , computer science , electrical engineering , telecommunications , wireless , programming language
A new rigorous diffraction coefficient formula for a two‐impedance wall right‐angled wedge is presented. A comparison of the total rigorous and heuristic field patterns is made for the same two impedance wall right‐angled wedge. The validity and applicability of this new rigorous diffraction coefficient formula are demonstrated through propagation path loss prediction around typical right‐angled scenarios. © 1998 John Wiley & Sons, Inc. Microwave Opt Technol Lett 17: 193–195, 1998.