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Determination of microwave intrinsic properties of hexaferrite samples
Author(s) -
Carvalho A. S.,
Gregori M. L.,
Chambers B.
Publication year - 1997
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19971220)16:6<393::aid-mop18>3.0.co;2-1
Subject(s) - microwave , dielectric , materials science , microwave applications , optics , optoelectronics , engineering , physics , telecommunications
Measurements of dielectric and magnetic properties of hexaferrite samples within the 8–16 GHz band using a rectangular waveguide are presented. The data are retrieved using the Nicolson–Ross–Weir (NRW) T/R method. Graphs of relative uncertainty for the permittivities' and permeabilities' measured and expected reflection losses for a metal‐backed single‐layer absorber are shown. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 16: 393–397, 1997.