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An efficient numerical scheme for fast parameter calculation of VLSI interconnection
Author(s) -
Zhao Yang,
Wang YunYi
Publication year - 1997
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(199709)16:1<48::aid-mop15>3.0.co;2-0
Subject(s) - very large scale integration , interconnection , substructure , scheme (mathematics) , finite element method , microwave , computer science , electronic engineering , topology (electrical circuits) , engineering , mathematics , electrical engineering , mathematical analysis , telecommunications , structural engineering
This letter proposes the substructure‐front (S‐F) technique in conjunction with the geometry‐independent measured equation of invariance (GIMEI) for fast parameter extraction of a multilayer and multiconductor interconnect based on the finite‐element method (FEM) for VLSI circuit analysis. Results show that they are in good agreement with the published results, and great computer resource can be saved via the efficient numerical scheme. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 16: 48–50, 1997.