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The phenomenological model of the microwave surface impedance of high‐temperature superconducting films with minimized number of fitting parameters
Author(s) -
Vendik Irina B.,
Kaparkov Dimitri I.,
Svishchev Alexey A.
Publication year - 1997
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(199709)16:1<14::aid-mop5>3.0.co;2-n
Subject(s) - microwave , phenomenological model , figure of merit , electrical impedance , superconductivity , materials science , penetration depth , condensed matter physics , london penetration depth , sheet resistance , residual , penetration (warfare) , atmospheric temperature range , electronic engineering , computational physics , electrical engineering , optics , optoelectronics , physics , thermodynamics , composite material , mathematics , engineering , algorithm , quantum mechanics , layer (electronics) , operations research
A correct phenomenological model of the microwave surface impedance of a high‐temperature superconducting (HTS) film with reduced number of fitting parameters is presented. Simple empirical expressions are proposed for London penetration depth at T =0 K and for the residual resistance parameter α versus the fitting parameter γ considered as a figure of merit of the HTS film at microwaves. The model is verified by a comparison of results of modeling and measurement data in a wide temperature range. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 16: 14–17, 1997.