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Generalized S ‐matrix calculation of waveguide discontinuities with the TLM method: application to two‐dimensional geometries
Author(s) -
Torre Jesús M.,
Rebollar Jesús M.
Publication year - 1997
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19970820)15:6<392::aid-mop15>3.0.co;2-4
Subject(s) - classification of discontinuities , discontinuity (linguistics) , waveguide , microwave , s matrix theory , scattering , matrix (chemical analysis) , optics , physics , voltage , amplitude , gsm , electronic engineering , engineering , mathematical analysis , mathematics , electrical engineering , materials science , telecommunications , composite material
A method for the calculation of the generalized scattering matrix (GSM) of an arbitrarily shaped discontinuity on a rectangular waveguide with 2‐D TLM is presented. The calculation procedure is based on the expansion of the TLM voltage impulses in the amplitudes of the modes supported by the waveguide. Results of the analysis of inductive irises on a rectangular waveguide are presented. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 15: 392–395, 1997.