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Scattering‐center analysis of radar targets with the use of the matrix pencil method combined with the GTD‐based model
Author(s) -
Cui Suomin,
Jin Dongxing,
Fang Dagang
Publication year - 1997
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(199703)14:4<244::aid-mop15>3.0.co;2-8
Subject(s) - matrix pencil , scattering , radar , pencil (optics) , microwave , matrix (chemical analysis) , range (aeronautics) , algorithm , iterative method , scattering parameters , computer science , physics , mathematics , acoustics , optics , engineering , telecommunications , materials science , aerospace engineering , eigenvalues and eigenvectors , quantum mechanics , composite material
An alternative technique that combines the matrix pencil (MP) method and the GTD‐based model is presented to estimate scattering center parameters including frequency dependence, down range, and amplitude from computed and measured scattering field data. The technique does not employ the time‐consuming iterative approach to estimate frequency dependence, so it has high computational effectiveness. Numerical results show the validity of the method presented in this Letter. If higher accuracy is required, one may take the results from this technique as initial estimates, then use the maximum‐likelihood algorithm to improve the accuracy. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 14, 244–247, 1997.