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An accurate determination of the Q factor of a dielectric resonator in a suspended substrate environment
Author(s) -
Kumar Pavan,
Shukla R. K.,
Biswas Animesh
Publication year - 1997
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19970205)14:2<128::aid-mop15>3.0.co;2-7
Subject(s) - resonator , q factor , substrate (aquarium) , dielectric , conductor , microwave , materials science , shielded cable , dielectric resonator , dielectric loss , dielectric resonator antenna , quality (philosophy) , optoelectronics , electrical engineering , electronic engineering , engineering , physics , telecommunications , composite material , oceanography , geology , quantum mechanics
An analytical technique for the determination of the Q factor of a dielectric resonator placed in a suspended substrate environment is presented in this article. Here, loss due to the conductor and dielectric loss due to the resonator and substrate are incorporated to find the unloaded quality factor ( Q u ). The validity of this theory is verified by experimental data available for a shielded environment. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 14, 128–130, 1997