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A generalized method for characterizing two‐dimensional scattering problems with spectral techniques
Author(s) -
Esteban H.,
López J. M.,
Boria V. E.,
Baquero M.,
Ferrando M.
Publication year - 1997
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(199701)14:1<6::aid-mop3>3.0.co;2-p
Subject(s) - method of moments (probability theory) , scattering , field (mathematics) , physical optics , matrix (chemical analysis) , optics , object (grammar) , function (biology) , computer science , physics , algorithm , mathematics , mathematical analysis , artificial intelligence , pure mathematics , materials science , statistics , estimator , evolutionary biology , composite material , biology
A new method for characterizing two‐dimensional metallic objects (scatterers) using spectral techniques is outlined. The physical optics method and the method of moments are compared in order to find the response of the scatterer. Several examples illustrate the ease with which one can find the scattered field by an object to any incidence with a unique matrix used as a transference function. © 1997 John Wiley & Sons, Inc.