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Accurate measurement of the Q factor for the cavity perturbation method
Author(s) -
Liu JiChyun,
Chou HsiChiang,
Chung JuChi,
Lu PoChiang
Publication year - 1996
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19961005)13:2<87::aid-mop9>3.0.co;2-h
Subject(s) - perturbation (astronomy) , physics , electronic engineering , computer science , optics , acoustics , mathematics , computational physics , engineering , quantum mechanics
The sensitivity of cavity Q‐factor measurements in the cavity perturbation method can be improved by using the differential averaging technique. The complex permittivity of low‐loss dielectric samples are accurately obtained by evaluating the differential averaging values among the original and perturbed frequency responses. © 1996 John Wiley & Sons, Inc.